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06/11/2019
Lmite 23 Oct 2021
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TODE20201016001
3D atomic force microscopy: New cantilevers for improved 3D sensitivity looking for licensees
A German research institute active in metrology has developed new cantilevers to improve the atomic force microscopy (AFM) measurements of three-dimensional structures. The system overcomes the problem of state of the art equipment during measurements of surfaces with different gradients - here commercially available cantilevers start to slide which leads to uncertainties. The research institute is searching for licensees and partners for research cooperation agreements.
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06/11/2019

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06/11/2019