A licensee sought for an advanced scanning X-ray fluorescence analyser of rather inorganic materials
Researchers from a Czech university developed a device based on X-ray fluorescence for non-destructive analysis of materials. The analyses with standard devices determine elemental composition only in a selected spot on an investigated object. This device enables scanning of a selected area with a variable detection angle, which makes possible to obtain surface distributions of present chemical elements with approximate depth distributions. Partners interested in licensing agreement are sought.